Books
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G. Catalan and N. Domingo, Physical properties inside domain walls: basic principles and scanning probe measurements, chapter in the book
Domain Walls - From Fundamental Properties to Nanotechnology Concepts, by Dennis Meier, Jan Seidel, Marty Gregg, and Ramamoorthy Ramesh (eds.),
Series on Semiconductor Science and Technology, Oxford Scholarship Online, October 2020. DOI: 10.1093/oso/9780198862499.001.0001
https://global.oup.com/academic/product/domain-walls-9780198862499?cc=us&lang=en&