Title
when samples get old
Technique
Atomic Force Microscopy
Description
Wrinkles generated at the surface of an organic thin film due to the glass to liquid transition occurring at the underlying organic layer, as observed with an Atomic Force Microscope. Within this study the nature of the devitrification transition in ultrastable glasses has been elucidated.

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Technical specifications
Atomic Force Microscopy image acquired at 349 K of a trilayer film of TCTA (13 nm)/TPD (63 nm)/TCTA (13 nm) grown on a silicon wafer by physical vapor deposition in vacuum. The devitrification of the sandwiched TPD induces wrinkling in the top TCTA layer due to the strain induced by the large difference in elastic moduli (solid vs. liquid).
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