Title
Electron Transparent
Technique
Optical Interference Microscopy
Description
Thin-film interference is a natural phenomenon in which light waves reflected by the upper and lower boundaries of a thin film interfere with one another, either enhancing or reducing the reflected light and producing colour contrast betwen the diferent thickness areas. In TEM sample preparation we use this technique to determine when a material is thin enough (<50nm for HRTEM) to be transparent to the electrons and therefore ready for a TEM characterization.

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Technical specifications
This image was donde using a optical microscope Leica DM 2700
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