Title
VO2 domains across the Meta-Insulator Transition: Electrical footprint
Technique
Scanning Kelvin Probe Microscopy (SKPM), an atomic force microscopy (AFM) mode.
Description
50x50 um image showing the effect of local strain-relaxation in the surface potential of VO2 domains across the metal-insulator transition.

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Technical specifications
Surface potential image taken with an Asylum MFP-3D atomic force microscope in a SKPM mode. The tip used was a PPP-EFM (Nanosensors) with Pt/Ir coating on either the tip and detector side. The scan was carried out in air at 20ºC.
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