16 October

Reliability testing methodology and lifetime modelling

Sala d'actes Pepe Millán, IMB-CNM, UAB Campus


By Prof. Zoubir Khatir, Institut Français des Sciences et Technologies des Transports, de l’Aménagement et des Réseaux, Satie, France

Abstract: Lifetime reliability testing of power electronic devices by using power cycling tests is required to build up lifetime models. With them, the power devices remaining useful lifetime can be assesed to practice predictive maintenance. In this sense, recent experimental works carried out at IFSTTAR will be presented, such as reliability testing methodologies, aging strategies, methods for failure mechanisms separation, and cumulative degradation assessment. Some specific results on WBG devices (GaN HEMTs) will be described. Finally, modeling aspects will be discussed, like building lifetime models based on electro-thermo-mechanical stresses and material degradations.