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Wednesday, 20 March 2013

ICN to receive ERDF funding for electron microscopes

European Regional Development Fund to provide ICN with over €1 million to purchase several high-performance electron microscopes, all of which are now in operation.

As part of its 2007-2013 Programa Operativo Objetivo 2 de Competitividad Regional y Ocupación de Catalunya funding scheme, the European Regional Development Fund (ERDF) has promised to provide ICN with financial support of over €1.1 million to help cover the recent purchase of four new electron microscopes and related equipment for the Institute's Electron Microscopy Division and Nanofabrication Division. The ERDF funds comprise €1.05 million to cover 50% of the costs of the microscopes (a Tecnai F20 S/TEM, a Magellan 400L SEM, a Quanta 650F ESEM and an Inspect F50 SEM, all from manufacturer FEI), as well as €108,000 for sample preparation equipment.

The recently installed microscopes, described below, will be used in nearly all lines of ICN research. Each instrument offers unique functionality for specific imaging tasks, such as surface characterisation, imaging of materials and biological samples or simultaneous chemical analysis.

According to Dr Belén Ballesteros, who leads ICN's Electron Microscopy Division, "The funding for equipment will be used to purchase an ion mill, a plasma cleaner, a sputter coater, a polisher and a diamond wire saw, among other tools."

Tecnai F20 S/TEM

• High resolution imaging in Transmission Electron Microscope (TEM) and Scanning Transmission Electron Microscope (STEM) modes

• High-voltage field-emission beam gun (200 kV)

• Equipped for chemical analysis via Energy Dispersive X-ray (EDX) Spectroscopy, Electron Energy Loss Spectroscopy (EELS)

• Equipped for electron tomography

• Amenable to crystallography studies

Magellan 400L SEM

• Offers extremely high resolution (< 1 nm), even at low voltages (excellent for surface imaging)

• Imaging capabilities in Scanning Electron Microscope (SEM) and Scanning Transmission Electron Microscope (STEM) modes

• Allows the study of non-conductive samples

Quanta 650F ESEM

• High resolution imaging operating at high vacuum, low vacuum and environmental pressure

• Can operate in charge-neutralisation mode to study non-conducting samples

• Broad range of operating temperatures: from 0 °C (using Peltier cell) up to 1,000 °C (using heating stage)

• Accepts large samples (e.g. silicon wafers up to 20 cm in diameter)

• Equipped for chemical analysis via Energy Dispersive X-ray (EDX) Spectroscopy

Inspect F50 SEM

• Equipped with Raith E-Beam Lithography (EBL) unit

• Enables rapid prototyping

• Offers feature sizes down to 50 nm

 

 

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As part of its 2007-2013 Programa Operativo Objetivo 2 de Competitividad Regional y Ocupación de Catalunya funding scheme, the European Regional Development Fund (ERDF) is to provide ICN with financial support of over  €1.1 million to purchase four new electron microscopes and related equipment for its Electron Microscopy Division and its Nanofabrication Division. The ERDF funds comprise €1.05 million to cover 50% of the costs of the microscopes (a Tecnai F20 S/TEM, a Magellan 400L SEM, a Quanta 650F ESEM and an Inspect F50 SEM, all from manufacturer FEI), as well as €108,000 for sample preparation equipment.

 

The microscopes, described below, will be used in nearly all lines of ICN research. Each instrument offers unique functionality for specific imaging tasks, such as surface characterisation, imaging of materials and biological samples or simultaneous chemical analysis.

 

According to Dr Belén Ballesteros, who leads ICN’s Electron Microscopy Division, “The funding for equipment will be used to purchase an ion mill, a plasma cleaner, a sputter coater, a polisher and a diamond wire saw, among other tools.”  

 

Tecnai F20 S/TEM

·        High resolution imaging in Transmission Electron Microscope (TEM) and Scanning Transmission Electron Microscope (STEM) modes

·        High-voltage field-emission beam gun (200 kV)

·        Equipped for chemical analysis via Energy Dispersive X-ray (EDX) Spectroscopy, Electron Energy Loss Spectroscopy (EELS)

·        Equipped for electron tomography

·        Amenable to crystallography studies

Magellan 400L SEM

·        Offers extremely high resolution (< 1 nm), even at low voltages (excellent for surface imaging)

·        Imaging capabilities in Scanning Electron Microscope (SEM) and Scanning Transmission Electron Microscope (STEM) modes

·        Allows the study of non-conductive samples

 

Quanta 650F SEM

·        High resolution imaging operating at high vacuum, low vacuum and environmental pressure

·        Can operate in charge-neutralisation mode to study non-conducting samples

·        Broad range of operating temperatures: from 0 °C (using Peltier cell) up to 1,000 °C (using heating stage)

·        Accepts large samples (e.g. silicon wafers up to 20 cm in diameter)

·        Equipped for chemical analysis via Energy Dispersive X-ray (EDX) Spectroscopy

 

Inspect F50 SEM

·        Equipped with Raith E-Beam Lithography (EBL) unit

·        Enables rapid prototyping

·        Offers feature sizes down to 50 nm

To learn more about ICN’s new microscopes, click here.