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Friday, 27 March 2015

The European project Automated In-Line Metrology For Nanoscale Production (aim4np) holds a meeting at ICN2

The fundamental goal of the project consists on establishing the primary competence needed for conducting the nanomechanical measurements in a production environment. ICN2 is, through the CSIC Prof Jordi Fraxedas and the ICN2 Group he leads, one of the members of this project coordinated by TU Delft.

Production technology is on the verge of a profound change by entering the nanometre domain. In-line metrology at this scale is a pre-requisite for reliability, high yield and throughput. The Automated In-Line Metrology For Nanoscale Production (aim4np) project will enable for the first time to measure relevant nanomechanical properties of devices and fabrication tools directly in the production line. After two years of collaborative work coordinated by TU Delft, the project members held a Meeting (March 19-20, 2015) to discuss the ongoing objectives at ICN2, one of the partners through the CSIC Prof Jordi Fraxedas and the ICN2 Group he leads.

 

The fundamental goal consists on establishing the primary competence needed for conducting the nanomechanical measurements in a production environment. This objective incorporates the need for new instrumental developments and innovation, and generation of new knowledge about the link between nanomechanical properties and functionality of surfaces. The consortium is organized in 6 scientific work packages, ranging from Metrology Platforms to Concept Validation, and composed of 4 SME and two large company partners, and knowledge providers from 2 universities and 2 public research centres. They have complementary competences in three different fields of instrumentation, in-line metrology, standardization and traceable measurements, and in two different application fields of thin-film technology.