Monday, 01 March 2021
Defects to the rescue: Exploiting defects at Van der Waals interfaces between layered materials
A paper recently published in the journal “Science Advances” demonstrates that defects in van der Waals materials, normally detrimental for device applications, can be exploited to capture and store charge carriers and therefore be beneficial for practical applications, such as photodetectors. Dr Klaas-Jan Tielrooij, leader of the Ultrafast Dynamics in Nanoscale Systems group at the ICN2, participated in this study.
