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Asylum MFP3D atomic force microscope

Asylum MFP3D atomic force microscope

The Asylum Research MFP-3D combines the versatility with high performance, powerful new capabilities, and a new system architecture designed for future expansion. The MFP-3D will support your most ambitious research projects, thanks to low noise opto-mechanics and sensored X.Y and Z-axis scanners, an all digital controller and its extreme software flexibility. The wide range of available options and accessories provides the laboratory with a complete catalogue of choices for nanoscale full characterization.

Technical specifications

  • Manufacturer: Asylum Research
  • Model: MFP-3D Classic
  • Temperature Range: -20 °C to 300 °C
  • Magnetic Field: 1 T in plane
  • High Voltage option: 220 V ac
  • Frequency Range: 0 - 2 MHz
  • Scan Axes:
    • X&Y: 90 mm Closed loop position control with sensor noise <0.5nm average deviation (Adev) in a 0.1Hz-1kHz bandwidth (BW) and sensor nonlinearity <0.5% (max deviation/full travel) at full scan.
    • X&Y: 15 mmSensor noise <0.25nm Adev in a 0.1Hz-1kHz BW and sensor non-linearity less than 0.05% (max deviation/full travel) at full scan.
    • Z height: noise <0.06nm Adev, 0.1Hz-1kHz BW.
  • Operating modes:
    • Contact Mode: Imaging using feedback on deflection. Height, deflection, and lateral forcé signals available.
    • AC and Dual ACTM: Q-controlled imaging using feedback on amplitude. Signals include height, amplitude/phase, I/Q, deflection; both air and fluid.
    • Force Mode: Force curve acquisition in contact or AC mode. All signals available.
    • Lateral Force: Frictional force imaging.
    • MicroAngelo: Built-in nanolithography/ nanomanipulation.
    • EFM, Surface Potential, Conductive AFM (CAFM) with ORCATM (sensitiviy range from 100 fA to 10 µA); Magnetic Force Microscopy (MFM), Variable Field MFM (VFM2 module - 1T in plane)
    • Piezoresponse Force Microscopy, Vector PFM, Switching Spectroscopy PFM (high voltaje up to 220 Vac/dc)
    • Scanning Kelvin Probe Microscopy (SKPM)
    • Dual AC Resonance Tracking (DART); DART PFM, Contact ressonance Microscopy.
    • Bimodal AFM.

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