X-Ray Diffraction Facility

This ICN2 X-Ray Diffraction Facility has two advanced X-ray diffractometers: X’Pert MPD, and MRD from PANalytical. These pieces of equipment are used to perform X-ray diffraction (XRD) analysis of nanopowders and thin films, and by doing so support the research activities of ICN2 groups and the surrounding research community. The instruments are quite versatile, allowing performance of routine powder analysis and phase identification, to more sophisticated measurements, including glancing angle diffraction, X-ray reflectometry, diffuse scattering studies in nanopowders (SAXS), high-resolution analysis and reciprocal space mapping in epitaxial films, in-plane diffraction, as well as diffraction under non-ambient conditions (high temperature and controlled atmosphere).

Available techniques

  • XRD of powder materials for the structural analysis of phases in both reflection and transmission geometries

  • Capillary measurements in transmission mode for liquid specimens or air-sensitive powder materials

  • Small-angle X-ray scattering (SAXS) for flat nanopowder samples in transmission geometry

  • XRD of thin films to identify phases and determine cell parameters, domain orientation and stress on epitaxy and polycrystalline films (at normal and high resolution)