Available techniques

• Elemental composition
• Detection of contaminants
• Quantitative analysis
• Determination of chemical or electronic state of each element on the surface
• Layer ordering in the first 8-10 nm (relative depth plot)
• Work function, ionization energy and valence band measurement using UPS
• Direct band mapping using ARUPS
• Temperature-dependent XPS measurements
• In-situ preparation of materials by thermal evaporation for later analysis