News

Tuesday, 02 August 2022

Novel electron-microscopy methodology enables sub-nanometer characterization of the electronic properties of semiconductor nanowires

In a study coordinated by ICREA Prof. Jordi Arbiol and his Advanced Electron Nanoscopy Group at the ICN2, and published in “Nature Communications”, arrays of core-shell nanowires made of two different semiconductors and grown horizontally on a planar surface are thoroughly analised by means of scanning transmission electron microscopy. This atomic-scale study is key to understanding how morphological characteristics affect opto-electronic, plasmonic, and quantum properties and how to control them for application in next-generation devices.