Thermo Fisher Scientific Spectra 300 (S)TEM

The Thermo Fisher Scientific Spectra 300 (S)TEM is a double-corrected transmission electron microscope, operated in either TEM or STEM mode, equipped with an ultra-high energy resolution field emission gun (X-FEG) and a monochromator (Ultimono). It is ideal for applications requiring the highest attainable spatial and energy resolution.

The Spectra 300 microscope is a joint initiative of several institutions of international prestige that have established a collaboration agreement, specifically the ICN2, CSIC (and its ICMAB-CSIC center), UAB, ALBA, with contributions also from BIST and Microsoft.

Technical specifications

• Acceleration voltages: : 60, 80, 200, 300 kV
• X-FEG UltiMono: High-brightness Schottky field emitter gun with ultra-stable monochromator and accelerating voltage.
• Double aberration S-CORR corrector: Corrects up to fifth order aberrations (A5) for all accelerating voltages with enhanced stability, thus providing sub-Angstrom imaging resolution at 60-300kV (below 50 pm in STEM mode at 300KV).
• Symmetric S-TWIN objective lens with wide-gap pole piece design of 5.4 mm
• Sample holders:
  • Single tilt (± 40º)
  • Low background double tilt (± 40º)
  • High tilt tomography (± 75º)
• Detectors:
  • On-axis and Off-axis HAADF detectors
  • New ultra-low noise Panther, on-axis solid state, 8 segmented BF and ADF detectors (16 segments in total)
  • Thermo Scientific Ceta™ 16M Camera
  • Gatan GIF Continuum K3 energy filter for EELS and EFTEM applications (>3000 spectra per second at >95% duty cycle), with Low-noise, high dynamic range CMOS 1069.EXUP (30-300 kV) detector and the K3 electron counting direct detector (80-300 kV) for the ultimate EELS and EFTEM data quality
  • Super-X windowless EDX (4 quadrant SDD EDX detection; solid angle > 0.7 srad)
  • Electron microscope pixel array detector (EMPAD) for 4D-STEM

Applications

• Dose-controlled high-resolution imaging (and diffraction) with variable high tension (60-300KV)
• Chemical mapping at sub-Angstrom level with simultaneous or independent Energy Dispersive X-ray Spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS) detection, and Energy Filtered TEM (EFTEM).
• Chemical analysis with EDX and DualEELS with high energy resolution (0.8eV without monochromator and 0.025eV with monochromator and Ultimono)
• 3D reconstruction of structures with Electron Tomography
• Study of beam sensitive samples using Low Dose, iDPC STEM and direct electron detection cameras