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Thermo Fisher Scientific Spectra 300 (S)TEM

The Thermo Fisher Scientific Spectra 300 (S)TEM is a double-corrected transmission electron microscope, operated in either TEM or STEM mode, equipped with an ultra-high energy resolution field emission gun (X-FEG) and a monochromator (Ultimono). It is ideal for applications requiring the highest attainable spatial and energy resolution.

The Spectra 300 microscope is a joint initiative of several institutions of international prestige that have established a collaboration agreement, specifically the ICN2, CSIC (and its ICMAB-CSIC center), UAB, ALBA, with contributions also from BIST and Microsoft.

Technical specifications

  • Acceleration voltages: : 60, 80, 200, 300 kV
  • X-FEG UltiMono: High-brightness Schottky field emitter gun with ultra-stable monochromator and accelerating voltage.
  • Double aberration S-CORR corrector: Corrects up to fifth order aberrations (A5) for all accelerating voltages with enhanced stability, thus providing sub-Angstrom imaging resolution at 60-300kV (below 50 pm in STEM mode at 300KV).
  • Symmetric S-TWIN objective lens with wide-gap pole piece design of 5.4 mm
  • Sample holders:
    • Single tilt (± 40º)
    • Low background double tilt (± 40º)
    • High tilt tomography (± 75º)
  • Detectors:
    • On-axis and Off-axis HAADF detectors
    • New ultra-low noise Panther, on-axis solid state, 8 segmented BF and ADF detectors (16 segments in total)
    • Thermo Scientific Ceta™ 16M Camera
    • Gatan GIF Continuum K3 energy filter for EELS and EFTEM applications (>3000 spectra per second at >95% duty cycle), with Low-noise, high dynamic range CMOS 1069.EXUP (30-300 kV) detector and the K3 electron counting direct detector (80-300 kV) for the ultimate EELS and EFTEM data quality
    • Super-X windowless EDX (4 quadrant SDD EDX detection; solid angle > 0.7 srad)
    • Electron microscope pixel array detector (EMPAD) for 4D-STEM

Applications

  • Dose-controlled high-resolution imaging (and diffraction) with variable high tension (60-300KV)
  • Chemical mapping at sub-Angstrom level with simultaneous or independent Energy Dispersive X-ray Spectroscopy (EDX) and Electron Energy Loss Spectroscopy (EELS) detection, and Energy Filtered TEM (EFTEM).
  • Chemical analysis with EDX and DualEELS with high energy resolution (0.8eV without monochromator and 0.025eV with monochromator and Ultimono)
  • 3D reconstruction of structures with Electron Tomography
  • Study of beam sensitive samples using Low Dose, iDPC STEM and direct electron detection cameras

Associated Groups/Units